In-situ electron microscopy : applications in physics, chemistry and materials science

フォーマット:
図書
責任表示:
edited by Gerhard Dehm, James M. Howe, and Josef Zweck
言語:
英語
出版情報:
Weinheim : Wiley-VCH, c2012
形態:
xviii, 383 p. : ill. ; 25 cm
著者名:
書誌ID:
BB09129991
ISBN:
9783527319732 [3527319735]  CiNii Books  Webcat Plus  Google Books
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