Fe/Tb薄膜におけるFe 2p XPS スペクトルの膜厚及び温度依存性

Format:

Article

Responsibility:

Serizawa, Yoshihiko ; Okusawa, Makoto ; 芹澤, 嘉彦 ; 奥沢, 誠

Language:

Japanese

Published:

群馬大学教育学部, 2012-02-14

Authors:

• Serizawa, Yoshihiko
• Okusawa, Makoto
• 芹澤, 嘉彦
• 奥沢, 誠

Publication info:

群馬大学教育学部紀要. 自然科学編

ISSN:

0017-5668    

Volume:

60

Start page:

33

End page:

40

Version:

VoR

Abstract:

Departmental Bulletin Paper<br />Seven Fe-films with a thickness different from one another have been prepared by deposited on clean Tb\nsurfaces with accuracy of 0.1 nm(Fe(d nm)/Tb(10.0nm) (d＝0.2,0.3,0.5,1.0,2.0,5.0,10.0)),and the Fe … 2p????????????\nXPS spectra of the films have been, in situ, measured at about 8K and room temperature. A shift in the\nbinding energy position of the Fe 2p????????????line is found to depend on the film thickness and the temperature. The\nshift at room temperature increases almost monotonously as the film thickness increases in the range of 0.2-\n2nm,and is nearly the same in the range of 2-10nm. The shift at about 8K,on the other hand,seems to have\na composite structure in the range of 0.2-2nm and is the same in the range of 2-10nm. Taking account of an\ninelastic mean-free-path of about 1.2nm in the Fe film, this implies that the influence of an interface on the\nelectronic states of the Fe atom as well as the Tb atom in Tb/Fe film and the Sm atom in Sm/Fe extends to\nabout 0.8nm from the interface at most and that some phase transition would exist between about 8K and room\ntemperature. Detailed discussion will be presented elsewhere. Read more